
Research interests
- Materials under extreme environments
- Mechanical and functional properties of thin films and coatings
- Photonic irradiation of metallic, ceramic, and polymeric surfaces, coatings, and thin films.
- Material's characterisation and nano-target preparation
- Materials for biomedical, industrial, and energy storage applications
- Nanomaterials
Research support at ORNL
Principal(*) or co-investigator
- *Advanced Battery Development: All solid state battery proof of principle, Office of Energy Efficiency and Renewable Energy - Vehicle Technologies Program, Department of Energy, C. Daniel, N. Dudney, B. Armstrong, J. Kiggans, $100K, 2008
- *Advanced Battery Development: Materials and Processing Assessment, Office of Energy Efficiency and Renewable Energy - Vehicle Technologies Program, Department of Energy, C. Daniel, $200K, 2007-2008
- *Advanced Laser Structuring Facility, Office of Energy Efficiency and Renewable Energy - Industrial Technologies Program, Department of Energy, C. Daniel, $150K
- Multifunctional Materials System for Energy Production and Storage, Defense Advanced Research Project Agency (DARPA), R. Ott, N. Dudney, C. Daniel, C. Duty (ORNL), $2.25M, 2007-2008
- Single Protein Actuation, Readout and Transduction of Affinity in Nanospace, Defense Advanced Research Project Agency (DARPA), J. Wikswo, P. Samson, R. Reiserer, R. Mernaugh, D. Markov, D. Li (Vanderbilt Univ.); C. Daniel (ORNL); B. Bomar, L. Davis, W. Hofmeister (UT Space Institute); A. Ellington, G. Georgiou, R. Hughes, B. Iverson, C. Leysath (Univ. Texas, Austin); W. Hamel (Univ. Tenn, Knoxville); G. Marriott (Univ. Wisconsin), $1.98M, Jan.-Dec. 2006
- A Hybrid Hydrogen Storage-Generation System Based on Bi-functional Nanostructured Photocatalysts, Laboratory Directed Research and Development Director's R&D Fund, ORNL, P. Datskos, B. Smith, N. Lavrik, V. Schwartz, C. Daniel, C. Tsouris (ORNL), $800K, 2006-2007
- Developing Nanocrystalline and Architectural Nanocomposite Materials for New Generation of Scintillation Detectors, Domestic and Nuclear Detection Office, Department of Homeland Security, M. Z. Hu, B. L. Armstrong, C. Daniel, Z. Bell (ORNL); S. A. Speakman (MIT), $600K, Feb. 2006-Feb. 2007
- *Laser Interference Direct Structuring of Zirconia for Dental Materials, Laboratory Directed Research and Development Seed Money Fund, ORNL, C. Daniel, N. B. Dahotre, B. L. Armstrong, P. J. Blau, J. Qu (ORNL), $42K, Aug. 2006-Sept. 2007
- Synergetic process enhanced grinding, Energy Efficiency and Renewable Energy Program, Department of Energy, R. H. Chand, C. Daniel (ORNL), $83.5K, 2006
- *Eugene P. Wigner Fellowship, Oak Ridge National Laboratory, $365K, Jul. 2005-Jul. 2007
Technical assistance / consultance
- Microstructure analysis of advanced ceramics, Basic Energy Sciences, Department of Energy, PI: P. F. Becher, $1.0M, 2006
- Nanocrystalline/Amorphous Silicon Thin-Film Composite for Stable High Efficiency Photovoltaic Applications, Laboratory Directed Research and Development Director's R&D Fund, ORNL, PI: R. D. Ott, $250K, 2006-2007
Teaching at Saarland University from 2002 to 2005
- Laser technique and safety
- Student's practical courses
- Methodical practice I (XRD)
- introduction in x-ray diffraction
- qualitative phase analysis
- texture analysis
- Methodical practice II (XRD)
- quantitative phase analysis
- single crystal analysis
- Quantitative analysis of micro-structures and image analysis
- Supervisor of seminars
- Talent promotion programm "Saarbrücker Juniorstudium"
Support and Maintenance of Technical Facilities in Functional Materials Group at Saarland University from 1998 to 2005
- High Resolution 7 Axis X-Ray Diffractometer (X'Pert, Panalytical)
incl. Optics for
Phaseanalysis, Texture, Stress, Grainsize, Filmthickness, Lattice plane constant, Single crystal analysis, Rocking curve, Reciprocal space map - pulsed High-Power-Nd:YAG-laser "QuantaRay" from Spectra Physics
Wave lengths: 1064, 532, 355, 266 nm
Pulse power: 200MW
Frequency: 10 Hz
Pulse duration for the fundamental: 10ns - White light interferometer from Zygo for 3D-surface analysis
lateral resolution: 300 nm
vertical resolution: 0,5 nm
Analysis in real and reciprocal space
profile and volume analysis
roughness - Focused Ion Beam / Scanning Electron - Dual beam microscope from FEI Company - deputy -
focused Ga-ion microscope
scanning electron microscope
analytics
modi: FIB, SEM, STEM, EBSD, EDX, micro manipulator - System for quantitative microstructure and image analysis
Olympus microscope
analysis system "a4i" from Aquinto